The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2007
Filed:
Aug. 03, 2004
Applicants:
Andreas Obrebski, Düesseldorf, DE;
Christoph Hauger, Aalen, DE;
Michael Haisch, Aalen, DE;
Fritz Straehle, Heubach, DE;
Inventors:
Andreas Obrebski, Düesseldorf, DE;
Christoph Hauger, Aalen, DE;
Michael Haisch, Aalen, DE;
Fritz Straehle, Heubach, DE;
Assignee:
Carl Zeiss AG, Oberkochen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/22 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscopy system and method provides functionalities for a user which are controllable by the user by displacing a body portion of the user. The functionalities comprise displacing a portion of a support mounting the microscopy optics and adjusting a stereo base for generating stereoscopic representations of an object.