The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2007
Filed:
Oct. 27, 2003
Kouji Ohsawa, Aichi, JP;
Tatsushi Takahashi, Aichi, JP;
Katsuhiro Natsume, Aichi, JP;
Takahiro Miura, Aichi, JP;
Kouji Ohsawa, Aichi, JP;
Tatsushi Takahashi, Aichi, JP;
Katsuhiro Natsume, Aichi, JP;
Takahiro Miura, Aichi, JP;
Nidek Co., Ltd., Aichi, JP;
Abstract
A surface inspection apparatus for inspecting a shape of an inspected surface of an object to be inspected includes: a supporting unit capable of supporting the object in a state in which the inspected surface is in a substantially vertical state; and a moving state which moves the object in a substantially vertical direction while the inspected surface is maintained in the substantially vertical state.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile