The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2007

Filed:

Jun. 07, 2004
Applicant:

Douglas L. Cohen, Fort Wayne, IN (US);

Inventor:

Douglas L. Cohen, Fort Wayne, IN (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of measuring a field-of-view (FOV) of an optical sensor includes the steps of: (a) uniformly illuminating a FOV of the optical sensor; (b) moving, at an angle of motion, a slit across the FOV and illuminating the optical sensor through the slit; (c) measuring an optical response of the sensor through the slit, at evenly spaced positions of the moving slit; (d) changing the angle of motion and repeating steps (b) and (c); (e) repeating step (d) for equally spaced angles of motion; and (f) constructing a two-dimensional map of the FOV of the optical sensor, after completing step (e). Constructing the two-dimensional map of the FOV includes filtering the measured data using a filtered backprojection algorithm, and interpolating among the filtered measured data to form the two-dimensional map.


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