The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2007

Filed:

May. 27, 2005
Applicants:

Chia-jun Chang, Taipei, TW;

Tzung-ming Chen, Taipei, TW;

Inventors:

Chia-Jun Chang, Taipei, TW;

Tzung-Ming Chen, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention discloses an impedance calibration circuit and method for calibrating an equivalent impedance of a semiconductor circuit element. The disclosed impedance calibration circuit includes a reference circuit, a second circuit element, and a controlling circuit. The reference circuit receives a test signal and outputs a first signal. The second circuit element is coupled to the semiconductor circuit element to form a test circuit and receives the test signal and outputs a second signal. The controlling circuit is coupled to the reference circuit and the test circuit for comparing the first signal with the second signal and adjusting the equivalent impedance of the semiconductor circuit element accordingly.


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