The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2007

Filed:

Aug. 16, 2002
Applicants:

Zhifeng Shao, Charlottesville, VA (US);

Sitong Sheng, Charlottesville, VA (US);

Shoudan Liang, Palo Alto, CA (US);

Inventors:

Zhifeng Shao, Charlottesville, VA (US);

Sitong Sheng, Charlottesville, VA (US);

Shoudan Liang, Palo Alto, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention relates generally to analysis of gene expression profiles. In particular, the present invention provides a method for a method for analyzing gene expression profiles of a cell, which method comprises: a) providing for isolated mRNA or cDNA target sequences from a cell; b) sequentially hybridizing said isolated mRNA or cDNA target sequences with a plurality of nucleotide probes; and c) assessing the sequential hybridization between said isolated mRNA or cDNA target sequences and said plurality of nucleotide probes to analyze gene expression profiles of said cell. Systems for analyzing gene expression profiles are also provided. Optical devices for detecting hybridization signal are further provided.


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