The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2007

Filed:

Nov. 14, 2003
Applicants:

Yukihito Furuhashi, Hachioji, JP;

Hiroshi Matsuzaki, Hachioji, JP;

Takao Shibasaki, Tokyo, JP;

Inventors:

Yukihito Furuhashi, Hachioji, JP;

Hiroshi Matsuzaki, Hachioji, JP;

Takao Shibasaki, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A three-dimensional model search method includes a step of producing a plurality of two-dimensional images obtained by observing a three-dimensional model as an object of search from points of view different from one another. In a first value extraction step, the respective feature values of the two-dimensional images are extracted from the plurality of two-dimensional images. In a search key input step, a two-dimensional image as a search key is inputted. In a second extraction step, the feature value is extracted from the two-dimensional image as the search key. In a similarity search step, the feature values extracted in the first and second extraction steps are used to carry out similarity search, and a three-dimensional model which is similar to the search key is outputted.


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