The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2007

Filed:

Jun. 30, 2003
Applicants:

Pyungchul Kim, Sammamish, WA (US);

C. James Maclennan, Redmond, WA (US);

Zhaohui Tang, Bellevue, WA (US);

Raman Iyer, Redmond, WA (US);

Inventors:

Pyungchul Kim, Sammamish, WA (US);

C. James MacLennan, Redmond, WA (US);

Zhaohui Tang, Bellevue, WA (US);

Raman Iyer, Redmond, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 17/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A drill-through feature is provided which provides a universal drill-through to mining model source data from a trained mining model. In order for a user or application to obtain model content information on a given node of a model, a universal function is provided whereby the user specifies the node for a model and data set, and the cases underlying that node for that model and data set are returned. A sampling of underlying cases may be provided, where only a sampling of the cases represented in the node is requested.


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