The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2007

Filed:

Aug. 20, 2004
Applicant:

Yorio Hidehira, Okayama, JP;

Inventor:

Yorio Hidehira, Okayama, JP;

Assignee:

MicroCraft, Okayama, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a method of apparatus for testing circuit boards which does not require any inner wide power plane so as to detect an open circuit defect and/or a short circuit defect in a conductor path network formed in the circuit board quickly and accurately. An apparatus for testing a circuit board according to the present invention includes a transmission unit () for transmitting electromagnetic (radio) wave signal by way of an antenna () to a circuit board () to be tested, a detecting unit () for detecting signal received by a conductor path () of the circuit board () by using the conductor path () as a receiving antenna, and compare unit () for determining whether or not there is an open circuit defect or a short circuit defect in the conductor path () by comparing the detected signal with reference data of corresponding to a conductor path not including any defect.


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