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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7187791 B1

PDFFull Text
Expired
Date of Patent:
Mar. 06, 2007

Filed:

Jun. 04, 2003

Coil sensitivity map generating method, parallel imaging method, and mri apparatus

Applicant:

Yoshikazu Ikezaki, Tokyo, JP;

Inventor:

Yoshikazu Ikezaki, Tokyo, JP;

Assignee:

GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);

Attorneys:

Carl B. Horton, Esq.

Armstrong Teasdale LLP

Primary Examiner:

Bhavesh M Mehta

Assistant Examiner:

Christopher Lavin

Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

For a purpose of improving homogeneity of an image obtained in a self-calibration by a parallel imaging method generally referred to as SENSE (SENSitivity Encoding), sensitivity factors S(p) are calculated using an additive image A=Σ|C| of complex images Cobtained by conducting a calibration scan of an entire FOV for phased array coils Coil_n (n=1–N, N≧2) (Steps V, V). Moreover, sensitivity maps Sare generated by conducting curve fitting by the method of least squares weighted by the square of a pixel value A(p) of the absolute value additive image A(Step V).

Find Patent Forward Citations

Ikezaki, Yoshikazu. (2007). Coil sensitivity map generating method, parallel imaging method, and mri apparatus (U.S. Patent No. 7187791). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7187791

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