The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2007
Filed:
Sep. 20, 2005
Jiang Hsieh, Brookfield, WI (US);
Erdogan O. Gurmen, Shorewood, WI (US);
Aziz Ikhlef, Waukesha, WI (US);
Bing Shen, Apex, NC (US);
Gregory Scott Zeman, Waukesha, WI (US);
Matthew Aaron Halsmer, Waukesha, WI (US);
Tyler Justin Sprenger, Milwaukee, WI (US);
Jiang Hsieh, Brookfield, WI (US);
Erdogan O. Gurmen, Shorewood, WI (US);
Aziz Ikhlef, Waukesha, WI (US);
Bing Shen, Apex, NC (US);
Gregory Scott Zeman, Waukesha, WI (US);
Matthew Aaron Halsmer, Waukesha, WI (US);
Tyler Justin Sprenger, Milwaukee, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for obtaining data includes scanning an object with radiation to collect projection data using an imaging system having a detector array with detector cells and a post-patient collimator, wherein the post-patient collimator has plates having non-uniform thicknesses. The method further includes applying a correction to the projection data to shift an effective center of at least some of the detector cells to compensate for the non-uniform thicknesses of the collimator plates.