The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2007
Filed:
Nov. 07, 2001
Applicant:
Pawel Drabarek, Tiefenbronn, DE;
Inventor:
Pawel Drabarek, Tiefenbronn, DE;
Assignee:
Robert Bosch GmbH, Stuttgart, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
An interferometric measuring device for measuring surface characteristics, shapes, distances, and changes in distance, for example vibrations, of measurement objects includes a probe section. A configuration with respect to ease of use and error-free scanning may be provided by the fact that the probe section is subdivided into a fixed probe section and a rotatable probe section mechanically and optically coupled thereto, and that a beam splitter is arranged in the rotatable probe section for creating a reference beam and a measuring beam for the interferometric measurement.