The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2007
Filed:
Jan. 23, 2003
Jorge Eduardo Franke, Orefield, PA (US);
John Sargent French, Palm, PA (US);
Sheldon Louis Sun, Allentown, PA (US);
William Joseph Thompson, Kempton, PA (US);
Jorge Eduardo Franke, Orefield, PA (US);
John Sargent French, Palm, PA (US);
Sheldon Louis Sun, Allentown, PA (US);
William Joseph Thompson, Kempton, PA (US);
Other;
Abstract
An error analysis tester for an optical component includes an optical transmitter, an optical attenuator, a port, a receiver, a processor and a graphical display. The optical transmitter and optical attenuator produce a test signal at a plurality of selected optical power levels. The port is configured to output the test signal to the optical component and to receive a version of the test signal from the optical component. The receiver determines errors in the received version of the test signal. The processor determines data points of a function associated with an error rate at each of the selected power levels and a line corresponding to the data points. The graphical display produces a visual plot of the data points and the corresponding line.