The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2007
Filed:
Jul. 25, 2005
Gerard J. Carlson, Boise, ID (US);
B. Mark Hirst, Boise, ID (US);
Mark Wibbels, Boise, ID (US);
Hewlett Packard Development Company, L.P., Houston, TX (US);
Abstract
A method for refining a length of a scan line, where the scan line is produced from a facet of a scanning device. The method includes the steps of: (a) acquiring a plurality of scan line lengths produced from the facet, (b) determining from the plurality of scan line lengths, an average scan line length for the facet, and (c) determining from the average scan line length, a scan line length correction for the facet. A method for measuring a length of a scan line includes the steps of: (a) charging an electrical current integrator to a voltage while a scan line is produced from a facet, (b) measuring the voltage, and (c) determining from the voltage, the length of the scan line produced from the facet.