The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2007

Filed:

Sep. 28, 2005
Applicants:

William D. Dallenbach, Sunnyvale, CA (US);

Divyasimha Harish, Union City, CA (US);

Inventors:

William D. Dallenbach, Sunnyvale, CA (US);

Divyasimha Harish, Union City, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An area-change sensing through capacitive techniques is disclosed. In one embodiment, a first conductive surface is substantially parallel to a second conductive surface. The first conductive surface may be moveable relative to the second conductive surface in a direction substantially parallel to the second conductive surface. A processing module may detect an overlap area between the first conductive surface and the second conductive surface. In addition, a reference surface may be substantially parallel to the first conductive surface and the second conductive surface. The processing module may be configured to measure a reference capacitance between the reference surface and a selected surface of the first conductive surface and the second conductive surface. The processing module may apply an algorithm that considers the reference capacitance and converts a change in capacitance between the first conductive surface and the second conductive surface to at least one of a voltage response and a frequency response to determine the measurement.


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