The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2007
Filed:
Mar. 05, 2002
Applicants:
Jürgen Müller, Hamburg, DE;
Stefan Hummel, Haseldorf, DE;
Inventors:
Jürgen Müller, Hamburg, DE;
Stefan Hummel, Haseldorf, DE;
Assignee:
Evotec OAI AG, Hamburg, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a method for analyzing a chemical and/or biological sample, particularly in high- and medium throughput screening systems, an observation beam () is focused in an observation volume () of the sample. For analyzing the sample, the observation beam () is moved in the sample. According to the inventions, to improve the quality of the measurement, the observation beam is moved continuously in the observation volume ().