The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2007

Filed:

Sep. 01, 2005
Applicant:

Larry L. Kiser, Lexington, KY (US);

Inventor:

Larry L. Kiser, Lexington, KY (US);

Assignee:

Lexmark International, Inc., Lexington, KY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03H 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for calibrating at least some individual light sensor elements of a linear sensor array of a scanner, wherein output values of first and second pluralities of elements are carried, respectively, by first and second output channels. A relative gain (Stored Gain) for each of such elements is calculated from a scan of a light calibration strip area of substantial uniformity. Output values of such elements are obtained from a scan of a light calibration strip area of unknown uniformity. An average is calculated of the obtained output values of the first elements (First Light Average) and an average is calculated of the obtained output values of the second elements (Second Light Average). A final gain for each first and second element is calculated using at least its Stored Gain and for second elements only also using the First and Second Light Averages.


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