The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2007
Filed:
Apr. 25, 2006
Olaf Schrey, Ratingen, DE;
Werner Brockherde, Duisburg, DE;
Bedrich Hosticka, Duisburg, DE;
Abstract
An indirect detection of the reflected radiation pulses, when measuring a distance by means of the photoeffect, allows considerably expanding the usability of the distance sensor and the distance measuring method, wherein the adaption to a new field of application only requires little design changes. Since in the external photoeffect the photoelectrons are ejected from the material irradiated photon by photon or quantum by quantum and the photons, when being ejected, only require a certain minimum energy and correspondingly the radiation used for irradiation only requires a sufficiently small wavelength, the external photoeffect allows detecting radiation over a large spectral range. When interferences occur in a certain wavelength range in a certain field of application, the operating wavelength range of the distance sensor technology may at first simply be set to another spectral range by using such an irradiation source having a spectrum outside the spectral range containing the interferences.