The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2007

Filed:

Jul. 18, 2005
Applicants:

Edward Charles Gage, Mars, PA (US);

Yiao-tee Hsia, Wexford, PA (US);

Wei Peng, Mars, PA (US);

James D. Kiely, Sewickley, PA (US);

Inventors:

Edward Charles Gage, Mars, PA (US);

Yiao-Tee Hsia, Wexford, PA (US);

Wei Peng, Mars, PA (US);

James D. Kiely, Sewickley, PA (US);

Assignee:

Seagate Technology LLC, Scotts Valley, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/28 (2006.01); G01B 7/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sensing contact probe includes a beam support and a probe. The probe has a bent beam body that extends from the beam support to a probe tip face that has a position and faces in an angular direction. The bent beam body has first and second beam layers bonded together and have differing residual stresses that bend the beam body. A stress relief region is formed in the bent beam body. The stress relief region has an adjusted stress property that adjusts the bending to control the probe tip face position and angular direction.


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