The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2007

Filed:

Mar. 08, 2005
Applicant:

Si-young Choi, Yongin-si, KR;

Inventor:

Si-young Choi, Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a measurement circuit and method for serially merging single-ended signals to analyze them. To analyze two differential signals probed from a DUT, that is, DP and DM signals, the measurement circuit detects DP data from which its DC portion has been removed and DM data from which its DC portion has been removed, stores the two data signals in a memory, and then serially merges the two data signals stored in the memory without distorting them. The measurement circuit divides the serially merged signal at a predetermined period and overlaps the divided signals to generate eye diagram data and analysis data including crossover voltages, rising time, falling time and so on.


Find Patent Forward Citations

Choi, Si-young. (2007). Measurement circuit and method for serially merging single-ended signals to analyze them (U.S. Patent No. 7185252). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7185252

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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