The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2007
Filed:
May. 18, 2004
Hironobu Sunden, Yokohama, JP;
Mitsunori Hamada, Kawasaki, JP;
Hironobu Sunden, Yokohama, JP;
Mitsunori Hamada, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
Performing delay measurement between master and slave devices. The master transmits a delay measuring signal at a fixed timing relative to a synchronous pattern signal in an overhead and transmits a frame signal in which an internal delay time, associated with a frame signal generation, from a delay measurement start timing to a transmission timing of the delay measuring signal is stored in the delay measuring signal as a master offset value. The slave adds an internal delay time associated with a frame signal generation to the master offset value of the frame signal, making a slave offset value and transmits an updated delay measuring signal with the slave offset value. The master calculates a delay time by subtracting the slave offset value from a time difference between a timing at which the delay measuring signal transmitted from the slave is received and the delay measurement start timing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile