The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2007
Filed:
Apr. 09, 2004
Takaaki Shimasaki, Kyoto, JP;
Akinori Yokogawa, Kyoto, JP;
Takaaki Shimasaki, Kyoto, JP;
Akinori Yokogawa, Kyoto, JP;
Rohm Co., Ltd, Kyoto, JP;
Abstract
The present invention provides a quantitative measurement method and quantitative measurement chip which can perform quantitative measurement of a target substance in a short period of time. The invention provides a quantitative measurement method in which a three dimensional mesh structure material is formed, and quantitative measurements are taken of the target substance using a structure which contains a reagent that reacts with the target substance in the mesh. This method includes a contacting step in which a test specimen which includes the target substance is brought into contact with the structure; a detecting step which, in a process in which a substance whose quantity will increase or decrease by means of the reaction between the target substance and the reagent, detects the substance whose quantity is increasing or decreasing within the structure at a contact interface between the test specimen and the reagent; and a quantitative measurement step which performs quantitative measurement of the target substance based on the results of the detecting step. The mesh structure will allow at least the target substance to pass therethrough.