The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2007
Filed:
Apr. 07, 2004
Applicants:
Lawrence C. Gunn, Iii, Encinitas, CA (US);
Roman Malendevich, Oceanside, CA (US);
Thierry J. Pinguet, Cardif-By-The-Sea, CA (US);
Maxime J. Rattier, Paris, FR;
Myles Sussman, San Diego, CA (US);
Jeremy Witzens, Pasadena, CA (US);
Inventors:
Lawrence C. Gunn, III, Encinitas, CA (US);
Roman Malendevich, Oceanside, CA (US);
Thierry J. Pinguet, Cardif-By-The-Sea, CA (US);
Maxime J. Rattier, Paris, FR;
Myles Sussman, San Diego, CA (US);
Jeremy Witzens, Pasadena, CA (US);
Assignee:
Luxtera, Inc, Carlsbad, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/34 (2006.01); G01R 31/302 (2006.01);
U.S. Cl.
CPC ...
Abstract
This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light from top of the wafer.