The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2007

Filed:

Apr. 07, 2004
Applicants:

Lawrence C. Gunn, Iii, Encinitas, CA (US);

Roman Malendevich, Oceanside, CA (US);

Thierry J. Pinguet, Cardif-By-The-Sea, CA (US);

Maxime J. Rattier, Paris, FR;

Myles Sussman, San Diego, CA (US);

Jeremy Witzens, Pasadena, CA (US);

Inventors:

Lawrence C. Gunn, III, Encinitas, CA (US);

Roman Malendevich, Oceanside, CA (US);

Thierry J. Pinguet, Cardif-By-The-Sea, CA (US);

Maxime J. Rattier, Paris, FR;

Myles Sussman, San Diego, CA (US);

Jeremy Witzens, Pasadena, CA (US);

Assignee:

Luxtera, Inc, Carlsbad, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/34 (2006.01); G01R 31/302 (2006.01);
U.S. Cl.
CPC ...
Abstract

This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light from top of the wafer.


Find Patent Forward Citations

Gunn, III, Lawrence. (2007). Wafer-level testing of optical and optoelectronic chips (U.S. Patent No. 7184626). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7184626

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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