The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2007

Filed:

Aug. 11, 2003
Applicants:

Ronald S. Weinstein, Tucson, AZ (US);

Michael R. Descour, Tucson, AZ (US);

Chen Liang, Tucson, AZ (US);

Peter H. Bartels, Tucson, AZ (US);

Roland V. Shack, Tucson, AZ (US);

Inventors:

Ronald S. Weinstein, Tucson, AZ (US);

Michael R. Descour, Tucson, AZ (US);

Chen Liang, Tucson, AZ (US);

Peter H. Bartels, Tucson, AZ (US);

Roland V. Shack, Tucson, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/50 (2006.01); G02B 21/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

An array of microscopes and a method of imaging an object with the array of microscopes. The array includes a plurality of optical elements being individually disposed with respect to a corresponding image plane and configured to image respective sections of an object, and includes a plurality of image sensors corresponding to respective optical elements and configured to capture corresponding representations of the respective sections of the object. The method includes imaging respective sections of an object with a plurality of optical elements and capturing corresponding representations of sections of the object from a plurality of image sensors.


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