The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2007

Filed:

Dec. 17, 2003
Applicants:

Shuichi Ohkubo, Tokyo, JP;

Hiromi Honma, Tokyo, JP;

Masatsugu Ogawa, Tokyo, JP;

Masaki Nakano, Tokyo, JP;

Toshiaki Iwanaga, Tokyo, JP;

Yutaka Kashihara, Yokohama, JP;

Yuuji Nagai, Yokohama, JP;

Inventors:

Shuichi Ohkubo, Tokyo, JP;

Hiromi Honma, Tokyo, JP;

Masatsugu Ogawa, Tokyo, JP;

Masaki Nakano, Tokyo, JP;

Toshiaki Iwanaga, Tokyo, JP;

Yutaka Kashihara, Yokohama, JP;

Yuuji Nagai, Yokohama, JP;

Assignees:

NEC Corporation, Tokyo, JP;

Kabushiki Kaisha Toshiba, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01);
U.S. Cl.
CPC ...
Abstract

In order to evaluate the quality of a signal recorded on an optical recording medium, a target signal is obtained based on a predetermined data string and a predetermined partial response characteristic, and for each clock cycle, an equalization error is calculated that is a difference between the target signal and a signal reproduced each clock cycle. Further, the product of the equalization errors calculated at different times is obtained, and based on the obtained product, the quality of a signal is evaluated.


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