The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7184337 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 27, 2007

Filed:

Aug. 29, 2005
Applicant:

Martin Versen, Feldkirchen-Westerham, DE;

Inventor:

Martin Versen, Feldkirchen-Westerham, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for testing an integrated semiconductor memory provides for disturbing memory cells arranged along a first word line by a disturbance signal on an adjacent word line. The memory cells along the first word line and bit lines, respectively, connected to them are subsequently connected simultaneously to a common data line via sense amplifiers, respectively, connected to them. The sense amplifiers assess the memory cells burdened by the disturbance signal and the capacitive load of the common data line and, respectively, refresh the disturbed memory state in the memory cells. The memory state refreshed in the memory cells is subsequently assessed in the context of a fast read access.


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