The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2007
Filed:
Dec. 16, 2004
George Dalakos, Niskayuna, NY (US);
Peter Lorraine, Niskayuna, NY (US);
Pingfan Wu, Niskayuna, NY (US);
Brian Lawrence, Clifton Park, NY (US);
William Taylor Yenisch, Longwood, FL (US);
George Dalakos, Niskayuna, NY (US);
Peter Lorraine, Niskayuna, NY (US);
Pingfan Wu, Niskayuna, NY (US);
Brian Lawrence, Clifton Park, NY (US);
William Taylor Yenisch, Longwood, FL (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
An IR limiting device for a detector that is based on a micro-optomechanical cantilever array is disclosed. In the normal state, each microcantilever device in the array behaves like a mirror that reflects the infrared signal to the detector. The microcantilever device absorbs radiation outside the desired infrared region. When the radiation is stronger than a predetermined threshold, the microcantilever device bends as a result of thermo-mechanical forces, and it reflects the signal away from the detector, thereby limiting the radiation. The advantage of such a system is that each pixel in the detector can be addressed individually, and the limiting is localized.