The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2007

Filed:

Mar. 17, 2005
Applicants:

Chao Zhang, Chengdu, CN;

Xuefei Zeng, Chengdu, CN;

Zhong Yang, Chengdu, CN;

Yuanjun Huang, Chengdu, CN;

Zhiyong Jiang, Chengdu, CN;

Jun Cao, Chengdu, CN;

Inventors:

Chao Zhang, Chengdu, CN;

Xuefei Zeng, Chengdu, CN;

Zhong Yang, Chengdu, CN;

Yuanjun Huang, Chengdu, CN;

Zhiyong Jiang, Chengdu, CN;

Jun Cao, Chengdu, CN;

Assignee:

Fiberxon Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 7/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for measuring gains of a plurality of photo diodes includes a chamber adapted to host the plurality of photo diodes and a temperature control unit configured to control the temperature within the chamber to a predetermined temperature. A control unit selects at least one of the plurality of photo diodes. A hosting unit is configured to provide a bias voltage to the selected photo diode at the predetermined temperature. A light source transmits photo signals to the selected photo diode at the predetermined temperature. A measurement unit configured to measure current signals generated by the selected photo diode in response to the photo signals under the bias voltage at the predetermined temperature.


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