The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2007
Filed:
Oct. 27, 2003
Daniel W. Van Der Weide, Madison, WI (US);
Robert J. Hamers, Madison, WI (US);
John R. Peck, Madison, WI (US);
Wei Cai, Madison, WI (US);
Daniel W. van der Weide, Madison, WI (US);
Robert J. Hamers, Madison, WI (US);
John R. Peck, Madison, WI (US);
Wei Cai, Madison, WI (US);
Wisconsin Alumni Research Foundation, Madison, WI (US);
Abstract
Radio-frequency (RF) excitation is used for direct detection of hybridization events at microelectrodes with surface-attached DNA oligomers. A homodyne reflectometer operates on a high frequency carrier to detect the presence of a low-frequency modulation signal. Without non-linearities in an interface, the modulation signal is not impressed upon the carrier signal. As such, the reflectometer can sensitively measure changes in dielectric properties without interference from other sources of capacitance/resistance unrelated to the reaction at the surface.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile