The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7182510 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 27, 2007

Filed:

Apr. 04, 2005
Applicant:

David Gerard Cahill, Champaign, IL (US);

Inventor:

David Gerard Cahill, Champaign, IL (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 25/18 (2006.01); G01K 1/00 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for measuring and mapping thermal conductivity and thermal diffusivity at micrometer scale resolution. The apparatus and method utilize a mode-locked femtosecond pulsed laser in a pump-probe configuration to analyze time-domain thermoreflectance of a specimen to evaluate its thermal conductivity in micro-scale, so that, if desired, an image of thermal conductivity distribution of micro-scale regions may be obtained therefrom. A multi-layer, complete three-dimensional model that takes into account the entire three-dimensional heat flow in cylindrical coordinates enables micro-scale measurements to be made at an accuracy of about 90% of well-accepted values.


Find Patent Forward Citations

Cahill, David. (2007). Apparatus and method for measuring thermal conductivity (U.S. Patent No. 7182510). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7182510

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