The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2007

Filed:

Feb. 15, 2006
Applicants:

Yan-rung Lin, Pingtung County, TW;

Shie-chang Jeng, Pingtung County, TW;

Chi-chang Liao, Tainen, TW;

Jyh-wen Shiu, Hsinchu County, TW;

Inventors:

Yan-Rung Lin, Pingtung County, TW;

Shie-Chang Jeng, Pingtung County, TW;

Chi-Chang Liao, Tainen, TW;

Jyh-Wen Shiu, Hsinchu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for inspecting a flexible device is provided, which is used for performing a performance inspection on a flexible device in a bending state, or after the flexible device has finished bending test so as to obtain a mechanical reliability. The inspecting system includes: at least one bending unit with at least one curvature; a conveyor unit used for conveying the flexible device so that a portion of the flexible device is passed through the bending unit and is bent into a bending portion; an inspecting unit performs a performance inspection on the flexible device. The performance inspection includes electrical, optical, or opto-electric inspection, and an inspection result can be recorded, displayed or both. The inspected flexible devices may be a flexible display device with complete or incomplete electrode thereon. In addition, a method for inspecting a flexible device is also provided.


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