The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2007
Filed:
Oct. 11, 2004
Wolfgang Haase, Sailauf, DE;
Gerhard Finger, Limeshain, DE;
Roman Koch, Blankenbach, DE;
GE Inspection Technologies GmbH, Alzenau, DE;
Abstract
A method and a device for testing a structural component having a complex surface contour utilizing ultrasound, at least one ultrasonic head (UPK) being guided along the surface contour (OK) of the structural component (BT) by means of a manipulator (MM) having several axial drives (MX, MJ, MZ, MA, MB) in several axes at a defined spacing (A) along the surface contour (OK) of the structural component (BT). To also ensure a high measuring accuracy in structural components which have a complex curved surface contour, the axial drives (MX, MJ, MZ, MA, MB) of the manipulator (MM) are synchronously moved along predetermined support points, a trigger drive (MRT) is controlled in synchronism with the axial drives (MX, MJ, MZ, MA, MB) and moved together with all engaged axial drives according to a predetermined surface line (OL) reproducing the surface contour (OK) and the trigger drive (MRT) generates equidistant trigger pulses relative to the surface line (OL) of the complex surface contour.