The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2007
Filed:
Jul. 26, 2002
Reconstruction of non-deterministic algorithmic tester stimulus used as input to a device under test
Alan S. Krech, Jr., Fort Collins, CO (US);
Stephen Dennis Jordan, Fort Collins, CO (US);
Hsiu-huan Shen, Saratoga, CA (US);
Alan S. Krech, Jr., Fort Collins, CO (US);
Stephen Dennis Jordan, Fort Collins, CO (US);
Hsiu-Huan Shen, Saratoga, CA (US);
Verigy Pte. Ltd., Singapore, SG;
Abstract
Input to a device under test (DUT) is reconstructed. For each trigger cycle of a tester in which data is to be input to the DUT stimulus, data is prepared to be placed as stimulus on pins of the DUT. Response information obtained from the DUT during a previous trigger cycle is used to construct formatting information used to adjust a value of the stimulus data. Reconstruction information sufficient to reconstruct the stimulus data is stored. The reconstruction information includes the formatting information. The reconstruction information is used to reconstruct the stimulus data placed on the pins of the device under test.