The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2007
Filed:
Sep. 16, 2003
Tord Björsne, Dietenhofen, DE;
Holger Dresel, Altendorf, DE;
Tord Björsne, Dietenhofen, DE;
Holger Dresel, Altendorf, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method to assist in the identification of a defective functional unit in a technical system that includes a number of functional units, a first test is implemented on the technical system for identification, the first tests implementing a measurement on the technical system and providing a first test result. Using a test model in which information is compiled about which functional units were tested, and using a system model in which information is compiled about the assembly of the technical system, an automated processing of the first test results is implemented. The first test result is analyzed in order to determine a group of functional units that may be defective, and using the analysis of the functional units of the group, defect probabilities are assigned.