The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2007
Filed:
Mar. 12, 2004
Integrated memory having redundant units of memory cells and method for testing an integrated memory
Aurel Von Campenhausen, München, DE;
Manfred Pröll, Dorfen, DE;
Jörg Kliewer, München, DE;
Stephan Schröder, München, DE;
Aurel von Campenhausen, München, DE;
Manfred Pröll, Dorfen, DE;
Jörg Kliewer, München, DE;
Stephan Schröder, München, DE;
Infineon Technologies AG, Munich, DE;
Abstract
An integrated memory has individually addressable normal and redundant units of memory cells. A memory unit is used to store, in a normal mode, an address for one of the normal units which needs to be replaced by one of the redundant units. A comparison unit compares an address which is present on an address bus with an address stored in the memory unit and activates one of the redundant units in the event of a match being identified. The memory also has a test circuit which can be activated by a test mode signal, can reset the memory unit to an initial state, and can store an address for one of the redundant units in the memory unit for subsequently writing an identification code to this redundant unit.