The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2007
Filed:
May. 26, 2005
Yoji Saito, Musashino, JP;
Kazuhiro Hashizumi, Musashino, JP;
Alex Legere, Avon, MA (US);
Hongli Du, Avon, MA (US);
Yoji Saito, Musashino, JP;
Kazuhiro Hashizumi, Musashino, JP;
Alex Legere, Avon, MA (US);
Hongli Du, Avon, MA (US);
Dresser, Inc., Addison, TX (US);
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
Process control systems may include one or more diagnostic systems and/or processes. In particular implementations, a diagnostic system and process for a field instrument may include the ability to divide a signal input range into a plurality of zones with respect to an input axis or a time axis, measure input response characteristics for a zone with the field instrument, and store measurement data points for the zone in memory of the field instrument. The diagnostic system and process may also include the ability to transmit the measurement data points for the zone to a host application and, while transmitting the measurement data points for the zone, measure input response characteristics for a second zone with the field instrument.