The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2007
Filed:
May. 05, 2004
Robert S. Kolman, Longmont, CO (US);
Reid Hayhow, La Porte, CO (US);
Robert S. Kolman, Longmont, CO (US);
Reid Hayhow, La Porte, CO (US);
Verigy Pte. Ltd., Singapore, SG;
Abstract
In a method for assigning test numbers, current testflow context information is maintained during execution of a testflow. The information is maintained as an array of one or more context values. Upon execution of a subtest in the testflow, a map of linked data nodes is indexed using a key formed from 1) a numeric identifier of the subtest, and 2) the array of context values. If a data node corresponding to the key exists in the map and is associated with a test number, the data node's test number is assigned to a result of the subtest; else, a new test number is assigned to the result of the subtest, and the new test number is associated with a data node that is linked in the map. A test number database, and a test number engine for satisfying calls for test numbers, are also disclosed.