The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2007
Filed:
Jun. 14, 1999
Ornan A. Gerstel, New York, NY (US);
Rajiv R. Ramaswami, Yorktown Heights, NY (US);
Robert Ward, St. Charles, IL (US);
Ornan A. Gerstel, New York, NY (US);
Rajiv R. Ramaswami, Yorktown Heights, NY (US);
Robert Ward, St. Charles, IL (US);
Tellabs Operations, Inc., Naperville, IL (US);
Abstract
A way of testing a wavelength division multiplexed (WDM) system without requiring connection to data source/sink equipment. A test signal is introduced onto a light path of interest in the system, and the test signal is monitored downstream for signal integrity. Lack of signal integrity is used to identify a fault in the lightpath. Alternatively, optical loopbacks may be used to localize and identify a fault in the lightpath. The lightpath includes a source optical node connected to a sink optical node via intermediate optical nodes. An optical signal introduced at the source node with a destination at the sink node may be looped back at any one of the intermediate nodes or the sink node to localize and identify a fault in the lightpath.