The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2007
Filed:
Jul. 12, 2002
Gwan Chong Joo, Hwasung, KR;
Jae Shik Choi, Hwasung, KR;
Ki Woo Chung, Hwasung, KR;
DO Hoon Kim, Hwasung, KR;
Gwan Chong Joo, Hwasung, KR;
Jae Shik Choi, Hwasung, KR;
Ki Woo Chung, Hwasung, KR;
Do Hoon Kim, Hwasung, KR;
Hantech Co., Ltd., Kyungki-do, KR;
Institute of Information Technology Assessment, Daejeon, KR;
Abstract
The disclosure is an optical measuring system and the method thereof for precisely measuring physical characteristics of light emitted from waveguides, such as beam size, pattern, strength, focusing, collimation degree, and divergence angle, by means of a plane optical detector in which a plurality of pixels formed by a semiconductor fabrication process are arranged in an array, without specific measuring means. The light is incident into ends of the arrayed waveguides with uniform time intervals and emitted from the other ends of the waveguides to reach the optical detectors through which the physical characteristics of the light are obtained and defined arithmetically.