The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2007

Filed:

Jun. 09, 2003
Applicant:

Mark L. Dell'eva, Grand Blanc, MI (US);

Inventor:

Mark L. Dell'Eva, Grand Blanc, MI (US);

Assignee:

Eaton Corporation, Cleveland, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging tool, including a lens, an imager, and a housing component, can be configured using a focus subsystem and an alignment subsystem. The focus subsystem can perform a focus heuristic using a source image to determine the appropriate focus of the lens. The alignment subsystem can perform an alignment heuristic using a calibration image to calculate the appropriate roll angle for the imager. The system can adjust the focus and alignment of the imaging tool in an automated manner. In some embodiments, the lens and alignment can be moved while they are within the housing component. System calculations can be performed accurately at the sub-pixel level. The system can be configured so that all computations are performed within the imaging tool itself, with the imaging tool passing messages to the configuration system regarding configuration instructions.


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