The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2007
Filed:
Mar. 31, 2003
David H. Minton, Stanardsville, VA (US);
Paul S. Fisher, Argyle, TX (US);
David H. Minton, Stanardsville, VA (US);
Paul S. Fisher, Argyle, TX (US);
Planning Systems Incorporated, Reston, VA (US);
Abstract
Embodiments of the present invention provide a method and system for a dynamic data correction appliance. A plurality of data points in a first domain may be sampled. The sampled data points may be transformed from the first domain to a second domain. The transformed data points may include a plurality of identified data points of interest in the second domain. Future data points may be predicted based on a forecast rule set and the plurality of data points of interest transformed to the second domain. The plurality of data points of interest transformed to the second domain may be compared with corresponding data points of interest included in the predicted future data points. An error measure based on the comparison may be calculated. It may be determined whether the error measure exceeds an error threshold. If the error measure exceeds the error threshold, a re-initialization process may be invoked.