The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2007

Filed:

Nov. 20, 2002
Applicants:

Robert J. Matreci, Santa Rosa, CA (US);

Eric N. Spotted-elk, Windsor, CA (US);

Peter A. Thysell, Windsor, CA (US);

Inventors:

Robert J. Matreci, Santa Rosa, CA (US);

Eric N. Spotted-Elk, Windsor, CA (US);

Peter A. Thysell, Windsor, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 3/46 (2006.01); H04B 17/00 (2006.01); H04B 7/00 (2006.01); H04B 1/04 (2006.01); H04Q 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of determining imbalance in a vector signal modulator. First and second channels of a vector signal modulator are stimulated with a multi-tone signal having a power versus frequency spectrum having numerous of frequencies. In response to the stimulation, an output of the vector signal modulator is measured. The first and second channels are simultaneously stimulated with a multi-tone signal having essentially the same characteristics as the one used when separately stimulating the channels. Data collected from both the separate and simultaneous stimulations are used to calculate imbalance versus frequency of the vector signal modulator. Alternatively, two channels of a vector signal modulator are simultaneously stimulated with first and second multi-tone signals. The first and second multi-tone signals have tones at main frequencies and at first and second offsets thereto, respectively. Output measurements are then made and imbalances are calculated.


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