The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2007

Filed:

Jun. 24, 2004
Applicants:

Akihiro Horii, Hachioji, JP;

Hitoshi Ueno, Hachioji, JP;

Shuhei Iizuka, Hachioji, JP;

Hitoshi Mizuno, Koganei, JP;

Tadashi Hirata, Hachioji, JP;

Inventors:

Akihiro Horii, Hachioji, JP;

Hitoshi Ueno, Hachioji, JP;

Shuhei Iizuka, Hachioji, JP;

Hitoshi Mizuno, Koganei, JP;

Tadashi Hirata, Hachioji, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical imaging apparatus has an optical scanning probe configured to irradiate low-coherence light onto a subject and to perform photo-reception of light scattered at the subject, and an observation device adapted to construct a cross-section image of the subject based on information from the light received through the optical scanning probe. The optical scanning probe is detachably connected to the observation device.


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