The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2007
Filed:
Nov. 24, 2004
Thorsten Bucksch, München, DE;
Thorsten Bucksch, München, DE;
Infineon Technologies AG, Munich, DE;
Abstract
The invention relates to a test device for testing digital semiconductor circuits at wafer level having a probe card which sends/receives digital test signals to/from a test head and distributes signal channels, carrying test signals, to the respective location on the wafer via an interposer. The interposer has a printed circuit board with contact pins on both sides, and a needle or contact stud card. Additionally, all signal channels in the test device or signal channels which carry time-critical test signals in the test device contain a respective signal amplifier, the signal amplifiers preferably being digital signal amplifiers which are mounted on the printed circuit board of the interposer.