The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2007
Filed:
Jun. 03, 2005
Atsushi Ohtake, Hitachiota, JP;
Kinya Kobayashi, Hitachi, JP;
Kiyomi Yoshinari, Hitachi, JP;
Toshiyuki Yokosuka, Hitachi, JP;
Atsumu Hirabayashi, Kodaira, JP;
Atsushi Ohtake, Hitachiota, JP;
Kinya Kobayashi, Hitachi, JP;
Kiyomi Yoshinari, Hitachi, JP;
Toshiyuki Yokosuka, Hitachi, JP;
Atsumu Hirabayashi, Kodaira, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In a method of measuring by a tandem mass spectrometer a sample labeled with an isotope, measuring throughput is improved. In a technique in which tandem mass spectrometer is used to analyze a sample labeled with an isotope, spectra obtained by a first-stage measurement (MS) are analyzed during a measuring session in a realtime fashion to determine ions to be used in second-stage and subsequent dissociation• spectral measurement (MS2).