The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2007
Filed:
Sep. 10, 2002
Jeremy Jerome, Carlsbad, CA (US);
Mark Daquipa, San Diego, CA (US);
Bruce Jacono, Ramona, CA (US);
Hans Boehringer, San Diego, CA (US);
Paul Lambotte, San Diego, CA (US);
Paul J. Lawrence, Pacific Grove, CA (US);
Jeremy Jerome, Carlsbad, CA (US);
Mark Daquipa, San Diego, CA (US);
Bruce Jacono, Ramona, CA (US);
Hans Boehringer, San Diego, CA (US);
Paul Lambotte, San Diego, CA (US);
Paul J. Lawrence, Pacific Grove, CA (US);
Quidel Corporation, San Diego, CA (US);
Abstract
A test device and method for determining the presence or absence of one or more analytes in a fluid sample, the test device including a support or member bearing a mark thereon, and a matrix or member containing a capture zone. In operation, an observation area in the test device becomes transparent, thereby allowing the user to view a mark that is present on a support that is disposed beneath the observation area. Typically, the mark on the underlying support is configured as a minus (−) sign. In the absence of analyte in the sample, the test device presents a negative result as a minus (−) signal. In the presence of analyte in the sample, however, the mark operates in concert with a perpendicular test line on the observation area to present a positive result as a plus (+) signal that is visible to the user.