The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2007

Filed:

Sep. 29, 2003
Applicants:

Nick M. Mitchell, White Plains, NY (US);

Gary Sevitsky, New York, NY (US);

Inventors:

Nick M. Mitchell, White Plains, NY (US);

Gary Sevitsky, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Analyzing the runtime behavior of a program given a set of one or more probes and points for inserting the probes for performing a specified inspection, includes providing a compiler with one or more of the following types of information about each probe: specifying the probe's context, its filter criteria, whether it is a fast-path probe, whether it is a timing probe, the probe's guard swing, the probe's context hardness, and the probe's temporal hardness; and compiling the program with the one or more probes and the information.


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