The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7178073 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 13, 2007

Filed:

Mar. 14, 2003
Applicants:

Stefan Dietrich, Türkenfeld, DE;

Matthias Grewe, München, DE;

Peter Mayer, München, DE;

Armin Rettenberger, München, DE;

Inventors:

Stefan Dietrich, Türkenfeld, DE;

Matthias Grewe, München, DE;

Peter Mayer, München, DE;

Armin Rettenberger, München, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01C 29/00 (2006.01); G11C 20/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for testing an electronic module having a memory cell device includes writing an information item to the memory cell device at a first clock frequency and then reading-out the information item from the memory cell device at a second clock frequency. The read out information item is reflected at a reflection point and is written back to the memory cell device at the second clock frequency. The reflected information unit is then read-out from the memory cell device with the first clock frequency.


Find Patent Forward Citations

Dietrich, Stefan. (2007). Test method and test apparatus for an electronic module (U.S. Patent No. 7178073). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7178073

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