The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2007
Filed:
Jun. 18, 2004
Ohad Falik, Kfar Saba, IL;
Joseph Wayne Freeman, Raleigh, NC (US);
Isaac Karpel, Cary, NC (US);
James S. Rutledge, Durham, NC (US);
Randall Scott Springfield, Chapel Hill, NC (US);
Ohad Falik, Kfar Saba, IL;
Joseph Wayne Freeman, Raleigh, NC (US);
Isaac Karpel, Cary, NC (US);
James S. Rutledge, Durham, NC (US);
Randall Scott Springfield, Chapel Hill, NC (US);
Lenovo (Singapore) Pte. Ltd., , SG;
Abstract
Methods and arrangements for capturing information related to operational conditions are disclosed. Embodiments include volatile memory to quickly record operational parameters via, e.g., basic input output system (BIOS) code, system management interrupt (SMI) code and/or executing applications. Many embodiments provide an alternative power source and a voltage switch to protect against loss of the information between storage in the volatile memory and storage in the non-volatile memory. Some embodiments include a read controller that provides access to the volatile memory when primary power is available. The read controller may also offer direct access to the non-volatile memory in case of a catastrophic failure that renders the processing device substantially non-functional. Further embodiments include a second processing device to generate a usage model and/or to perform diagnostics with the operational parameters.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile