The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2007

Filed:

Dec. 31, 2002
Applicants:

Nainesh Agarwal, Victoria, CA;

Anant Sahai, Berkeley, CA (US);

John Tsitsiklis, Lexington, MA (US);

Inventors:

Nainesh Agarwal, Victoria, CA;

Anant Sahai, Berkeley, CA (US);

John Tsitsiklis, Lexington, MA (US);

Assignee:

SiRF Technology, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

System and method for mitigating the effects of narrowband noise in a location-determining signal are provided, wherein the location-determining signal is associated with a periodic reference signal, the embodiments include identifying a set of noisy frequencies in the signal, determining a set of frequencies to be removed, and removing the set of frequencies from either the location-determining signal or the reference signal, thereby removing the effects of narrowband noise from the location-determining signal.


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