The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2007
Filed:
Oct. 06, 2003
Applicants:
Digant P. Dave, Austin, TX (US);
Thomas E. Milner, Austin, TX (US);
Taner Akkin, Boston, MA (US);
Inventors:
Assignee:
Board of Regents the University of Texas System, Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/27 (2006.01); G02B 6/26 (2006.01); G01J 4/00 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
Generally, and in one form of the present invention, is a polarization-maintaining fiber-based polarization sensitive optical low coherence reflectometer for depth resolved birefringence measurement. With the present invention, linear birefringence of a sample may be measured from data recorded in a single A-Scan. In addition, the present invention provides for the simultaneous measurement of retardation and orientation of birefringent axes, wherein measured retardation is insensitive to sample rotation in the plane perpendicular to ranging.